Analysis of the effect of small-scale inhomogeneities on the electrophysical characteristics of a thin layer by intracavity laser spectroscopy-Reference-Cited by-同舟云学术

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Analysis of the effect of small-scale inhomogeneities on the electrophysical characteristics of a thin layer by intracavity laser spectroscopy

Published:2011-09 Issue:9 Volume:56 Page:1302-1309
ISSN:1063-7842
Container-title:Technical Physics
language:en
Short-container-title:Tech. Phys.

Author:

Kulikov K. G.

Publisher

Pleiades Publishing Ltd

Subject

Physics and Astronomy (miscellaneous)

Link

http://link.springer.com/content/pdf/10.1134/S1063784211090106.pdf

Reference6 articles.

1. K. G. Kulikov and A. M. Radin, Opt. Spektrosk. 92, 228 (2002) [Opt. Spectrosc. 92, 199 (2002)].

2. K. G. Kulikov and A. M. Radin, Opt. Spektrosk. 96, 522 (2004) [Opt. Spectrosc. 92, 613 (2004)].

3. K. G. Kulikov, Zh Tekh. Fiz. 79(2), 96 (2009) [Tech. Phys. 54, 259 (2009)].

4. S. M. Rytov, Yu. A. Kvartsov, and V. I. Tatarskii, Introduction to Statistical Radiophysics, Part 2: Random Fields (Nauka, Moscow, 1978) [in Russian].

5. A. N. Bogolyubov and A. A. Tikhonravov, Vestn. Mosk. Univ., Ser. 3: Fiz., Astron., No. 3, 27 (2002).

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