1. I. A. Artioukov, R. M. Fechtchenko, A. L. Udovskii, et al., Nucl. Instrum. Methods Phys. Res. A 517, 372 (2004).
2. D. Oliphant, Caracterization of Uranium, Uranium Oxide and Silicon Multilayer Films: Masters Thesis (Brigham Young University, Provo, 2000), p. 63.
3. D. D. Allred, et al., Proc. SPIE 4782, 212 (2000).
4. I. A. Artioukov, R. M. Fechtchenko, A. V. Vinogradov, et al., in Proceedings of the 18th International Conference on X-ray Optics and Microanalysis (ICXOM-XVIII), Frascati, 2005, p. 64.
5. G. F. Ivanovskii and V. I. Petrov, Ion-Plasma Treatment of Materials (Radio i Svyaz’, Moscow, 1986) [in Russian].