1. A. J. Schwartz, M. Kumar, and B. L. Adams, Electron Backscatter Diffraction in Materials Science (Kluwer Academic-Plenum, New York, 2000).
2. J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, A.D. Romig, C. E. Lyman, C. Fiori, and E. Lifshin, Scanning Electron Microscopy and X-ray Microanalysis (Lehigh University, Bethlehem, 1981; Mir, Moscow, 1984), Chap. 1.
3. Yu. N. Nozdrin, E. E. Pestov, V. V. Kurin, S. V. Baryshev, A. V. Bobyl’, S. F. Karmanenko, D. A. Sakseev, and R. A. Suris, Fiz. Tverd. Tela (St. Petersburg) 48, 2136 (2006) [Phys. Solid State 48, 2260 (2006)].
4. B. M. Koshelev, From Stoletov’s Electrical Eye to Contemporary TV http://www.rt.mipt.ru/misc/radio/index7.html .
5. A. Blaker, Handbook for Scientific Photography (2nd ed., Focal Press, New York, 1989; Mir, Moscow, 1980).