Determination of the impact excitation cross section for luminophor activators using voltage-luminance characteristics of thin-film electroluminescent structures-Reference-Cited by-同舟云学术

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Determination of the impact excitation cross section for luminophor activators using voltage-luminance characteristics of thin-film electroluminescent structures

Published:2001-04 Issue:4 Volume:27 Page:341-343
ISSN:1063-7850
Container-title:Technical Physics Letters
language:en
Short-container-title:Tech. Phys. Lett.

Author:

Samokhvalov M. K.,Davydov R. R.,Khadiullin É. I.

Publisher

Pleiades Publishing Ltd

Subject

Physics and Astronomy (miscellaneous)

Link

http://link.springer.com/content/pdf/10.1134/1.1370221.pdf

Reference9 articles.

1. R. Mach and G. O. Muller, Phys. Status Solidi 81(2), 609 (1984).

2. M. K. Samokhvalov, Zh. Tekh. Fiz. 66(10), 139 (1996) [Tech. Phys. 41, 1045 (1996)].

3. M. K. Samokhvalov, Thin-Film Electroluminescent Radiation Sources (Ul’yanovs. Gos. Tekh. Univ., Ul’yanovsk, 1999).

4. M. K. Samokhvalov, Zh. Prikl. Spektrosk. 62(3), 182 (1995).

5. M. K. Samokhvalov, Pis’ma Zh. Tekh. Fiz. 21(15), 78 (1995) [Tech. Phys. Lett. 21, 621 (1995)].

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1. Determination of the parameters of phosphor activators in thin-film electroluminescent capacitor structures;Technical Physics Letters;2002-12

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