Structural, Thermal and Luminescence Properties of AlN:Tm Thin Films Deposited on Silicon Substrate and Optical Fiber-Reference-Cited by-同舟云学术

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Structural, Thermal and Luminescence Properties of AlN:Tm Thin Films Deposited on Silicon Substrate and Optical Fiber

Published:2018-12 Issue:16 Volume:52 Page:2039-2045
ISSN:1063-7826
Container-title:Semiconductors
language:en
Short-container-title:Semiconductors

Author:

Muhammad Maqbool ,Alruwaili Amani,Milinovic Dunja,Khan Tahirzeb,Ali Ghafar,Ahmad Iftikhar

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/article/10.1134/S1063782618160182/fulltext.html

Reference18 articles.

1. M. Maqbool, I. Ahmad, H. H. Richardson, and M. E. Kordesch, Appl. Phys. Lett. 91, 193511 (2007).

2. M. Maqbool, K. Main, and M. E. Kordesch, Opt. Lett. 35, 3637 (2010).

3. G. S. Sudhir, H. Fujii, W. S. Wong, C. Kisielowski, N. Newman, C. Dieker, Z. Liliental-Weber, M. D. Rubin, and E. R. Weber, J. Electron. Mater. 27, 215 (1998).

4. S. Venkataraj, D. Severin, R. Drese, F. Koerfer, and M. Wuttig, Thin Solid Films 502, 235 (2006).

5. Y. Huang, X. Duan, Y. Cui, and C. M. Lieber, Nanoletters 2, 101 (2002).

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2. Fabrication and Ions Irradiation Study of AlN:Gd Thin Films;ECS Journal of Solid State Science and Technology;2022-04-01

3. Response of structural and optical properties against proton irradiation in AlN:Tm thin films;Radiation Physics and Chemistry;2021-03

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