Correlation of Physical and Information Entropies in Reliability Theory for Nanoscale Elements-Reference-Cited by-同舟云学术

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Correlation of Physical and Information Entropies in Reliability Theory for Nanoscale Elements

Published:2020-12 Issue:13 Volume:54 Page:1805-1810
ISSN:1063-7826
Container-title:Semiconductors
language:en
Short-container-title:Semiconductors

Author:

Kozhevnikov V. S.,Matyushkin I. V.,Chernyaev N. V.,Zhukova T. D.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1063782620130096.pdf

Reference10 articles.

1. W. Kuo, IEEE Trans. Reliab. 55, 569 (2006).

2. O. Triebl, Doctoral (Tech. Sci.) Dissertation (Vienna, 2012). http://www.iue.tuwien.ac.at/phd/triebl/. Accessed June 16, 2019.

3. Z. Matic and V. Sruk, in Proceedings of the 30th International Conference on Information Technology Interfaces, Croatia, 2008 (IEEE, 2008), p. 745.

4. M. M. Azzam and A. M. Awad, Microelectron. Reliab. 36, 1569 (1996).

5. I. T. Aleksanyan and N. V. Chernyaev, Peterb. Zh. Elektron. 1 (4), 56 (1994).

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