Study of the parameters of nanoscale layers in nanoheterostructures based on II–VI semiconductor compounds-Reference-Cited by-同舟云学术

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Study of the parameters of nanoscale layers in nanoheterostructures based on II–VI semiconductor compounds

Published:2017-01 Issue:1 Volume:51 Page:54-60
ISSN:1063-7826
Container-title:Semiconductors
language:en
Short-container-title:Semiconductors

Author:

Karavaev M. B.,Kirilenko D. A.,Ivanova E. V.,Popova T. B.,Sitnikova A. A.,Sedova I. V.,Zamoryanskaya M. V.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1063782617010080.pdf

Reference9 articles.

1. M. V. Zamoryanskaya, S. G. Konnikov, and A. N. Zamoryanskii, Instrum. Exp. Tech., 47, 477 (2004).

2. D. Drouin, A. R. Couture, D. Joly, X. Tastet, V. Aimez, and R. Gauvin, Scanning, 29, 92 (2007).

3. T. B. Popova, L. A. Bakaleinikov, M. V. Zamoryanskaya, and E. Yu. Flegontova, Semiconductors, 42, 669 (2008).

4. H. Okuyama, Y. Kishita, and A. Ishibashi, Phys. Rev. B, 57, 2257 (1998).

5. V. Pellegrini, R. Atanasov, A. Tredicucci, and F. Beltram, Phys. Rev. B, 51, 5171 (1995).

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2. Non-destructive evaluation of depth, thickness and composition of single ZnCdSe nanolayers buried in II-VI heterostructures;Superlattices and Microstructures;2018-10

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