Structural Characterization of a Short-Period Superlattice Based on the CdF2/CaF2/Si(111) Heterostructure by Transmission Electron Microscopy and X-Ray Diffractometry-Reference-Cited by-同舟云学术

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Structural Characterization of a Short-Period Superlattice Based on the CdF2/CaF2/Si(111) Heterostructure by Transmission Electron Microscopy and X-Ray Diffractometry

Published:2021-12 Issue:12 Volume:47 Page:893-896
ISSN:1063-7850
Container-title:Technical Physics Letters
language:en
Short-container-title:Tech. Phys. Lett.

Author:

Sorokin L. M.,Kyutt R. N.,Ratnikov V. V.,Kalmykov A. E.

Publisher

Pleiades Publishing Ltd

Subject

Physics and Astronomy (miscellaneous)

Link

https://link.springer.com/content/pdf/10.1134/S1063785021080125.pdf

Reference13 articles.

1. L. Esaki and R. Tsu, IBM J. Res. Develop. 14, 61 (1970). https://doi.org/10.1147/rd.141.0061

2. A. Spindlberger, D. Kysylychyn, L. Thumfart, R. Adhikari, A. Rastelli, and A. Bonannia, Appl. Phys. Lett. 118, 062105 (2021). https://doi.org/10.1063/5.0040811

3. R. Ramesh and D. G. Schlom, Nat. Rev. Mater. 4, 257 (2019). https://doi.org/10.1038/s41578-019-0095-2

4. S. Das, A. Ghosh, M. R. McCarter, S.-L. Hsu, Y.-L. Tang, A. R. Damodaran, R. Ramesh, and L. W. Martin, APL Mater. 6, 100901 (2018). https://doi.org/10.1063/1.5046100

5. H.-U. Habermeier, Low Temp. Phys. 42, 840 (2016). https://doi.org/10.1063/1.4965889

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