Cluster diagnostics in Si1−x Ge x solid solutions using low-energy ion backscattering spectroscopy-Reference-Cited by-同舟云学术

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Cluster diagnostics in Si1−x Ge x solid solutions using low-energy ion backscattering spectroscopy

Published:2007-05 Issue:5 Volume:33 Page:377-379
ISSN:1063-7850
Container-title:Technical Physics Letters
language:en
Short-container-title:Tech. Phys. Lett.

Author:

Babenko P. Yu.,Shergin A. P.

Publisher

Pleiades Publishing Ltd

Subject

Physics and Astronomy (miscellaneous)

Link

http://link.springer.com/content/pdf/10.1134/S1063785007050057.pdf

Reference7 articles.

1. A. P. Shergin, P. Yu. Babenko, and V. M. Mikouskin, Izv. Ross. Akad. Nauk, Ser. Fiz. 68, 380 (2004).

2. A. P. Shergin and A. V. Shaikin, Izv. Ross. Akad. Nauk, Ser. Fiz. 66, 467 (2002).

3. E. S. Mashkova and V. A. Molchanov, Medium-Energy Ion Scattering by Solid Surfaces (Atomizdat, Moscow, 1980) [in Russian].

4. P. Yu. Babenko and A. P. Shergin, Pis’ma Zh. Éksp. Teor. Fiz. 84, 451 2006) [JETP Lett. 84, 377 (2006)].

5. I. F. Urazgildin, Izv. Ross. Akad. Nauk, Ser. Fiz. 60(7), 44 (1996).

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