Selective analysis of the elemental composition of InGaAs/GaAs nanoclusters by secondary ion mass spectrometry-Reference-Cited by-同舟云学术

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Selective analysis of the elemental composition of InGaAs/GaAs nanoclusters by secondary ion mass spectrometry

Published:2017-05 Issue:5 Volume:43 Page:477-480
ISSN:1063-7850
Container-title:Technical Physics Letters
language:en
Short-container-title:Tech. Phys. Lett.

Author:

Drozdov M. N.,Danil’tsev V. M.,Drozdov Yu. N.,Khrykin O. I.,Yunin P. A.

Publisher

Pleiades Publishing Ltd

Subject

Physics and Astronomy (miscellaneous)

Link

http://link.springer.com/content/pdf/10.1134/S1063785017050170.pdf

Reference9 articles.

1. M. N. Drozdov, Yu. N. Drozdov, A. V. Novikov, P. A. Yunin, and D. V. Yurasov, Semiconductors 48, 1109 (2014).

2. M. N. Drozdov, Yu. N. Drozdov, N. D. Zakharov, D. N. Lobanov, A. V. Novikov, P. A. Yunin, and D. V. Yurasov, Tech. Phys. Lett. 40, 601 (2014).

3. M. N. Drozdov, Yu. N. Drozdov, A. V. Novikov, P. A. Yunin, and D. V. Yurasov, Tech. Phys. Lett. 42, 243 (2016).

4. R. G. Wilson, Int. J. Mass Spectrom. Ion Processes 143, 43 (1995).

5. A. Franquet, B. Douhard, D. Melkonyan, et al., Appl. Surf. Sci. 365, 143 (2016).

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