Author:
Syryamkin V. I.,Klestov S. A.,Suntsov S. B.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference15 articles.
1. Syryamkin, V.I., Digital X-ray 3D-microtomograph for testing materials and components used in electronics, Russ. J. Nondestr. Test., 2016, vol. 52, no. 9, pp. 504–511.
2. Klestov, S.A., Syryamkin, V.I., and Suntsov, S.B., Digital 3D X-ray microtomographic scanners for electronic equipment testing, Int. Conf. “Actual Trends in Radiophysics” (Tomsk, October 1—4, 2019), J. Phys. Conf. Ser., Tomsk: IOP Publ., 2020, p. 012045.
3. Syryamkin, V.I., Klestov, S.A., and Suntsov, S.B., Digital X-ray Tomography, Red Square Sci., 2020, 2nd ed.
4. Klestov, S.A., Kuznetsov, D.N., and Suntsov, S.B., Digital 3D x-ray microtomographic scanners for electronic equipment testing, III Int. Conf. “Cognitive Robotics,” Tomsk, 2018, p. 012026. Klestov, S.A., Kuznetsov, D.N., and Suntsov, S.B., Digital 3D x-ray microtomographic scanners for electronic equipment testing (Tomsk, November 22–24, 2018), IOP Conf. Ser. Mater. Sci. Eng., Tomsk: IOP Publ., 2019, p. 012026.
5. Syryamkin, V.I., Klestov, S.A., and Baus, S.S., Methodology of visualization and study of the internal structure of organic and inorganic materials, Gl. Mekh., 2018, no. 10, pp. 74–77.
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