1. A. Baksi, S. Bhasin, J. Breier, D. Jap, and D. Saha, “A survey on fault
attacks on symmetric key cryptosystems,” ACM Comput. Surv. 55 (4), 86 (2022).
2. J. Breier and D. Jap, “A survey of the state-of-the-art fault attacks,”
Proc. 14th Int. Symp. Integr. Circuits (Singapore,
December 10–12, 2014) (IEEE, Piscataway, 2014), 152–155.
3. C. Giraud and H. Thiebeauld, “A survey on fault attacks,” Smart Card Res. Adv. Appl. VI. IFIP 18th World Comput. Congr. TC8/WG8.8
& TC11/WG11.2 6th Int. Conf. (Toulouse, France, August 22–27, 2004)
(Kluwer Acad. Publ., New York, 2004), 159–176.
4. C. H. Kim and J.-J. Quisquater, “Faults, injection methods, and fault
attacks,” IEEE Des. Test Comput. 24 (6), 544–545
(2007).
5. A. Gangolli, Q. H. Mahmoud, and A. Azim, “A systematic review of fault
injection attacks on IoT systems,” Electronics 11 (13),
2023 (2022).