High-resolution transmission electron microscopy for crystallographic study of nanomaterials-Reference-Cited by-同舟云学术

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High-resolution transmission electron microscopy for crystallographic study of nanomaterials

Published:2011-07 Issue:4 Volume:56 Page:650-661
ISSN:1063-7745
Container-title:Crystallography Reports
language:en
Short-container-title:Crystallogr. Rep.

Author:

Imamov R. M.,Klechkovskaya V. V.,Suvorova E. I.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1134/S1063774511040079.pdf

Reference43 articles.

1. B. K. Vainshtein, Structure Analysis by Electron Diffraction (Akad. Nauk SSSR, Moscow, 1956; Pergamon, 1964).

2. B. K. Vainshtein and J. A. Ibers, Kristallografiya 3(2), 416 (1958) [Sov. Phys. Crystallogr. 3 (2), 417 (1958)].

3. B. K. Vainshtein and Z. G. Pinsker, Dokl. Akad. Nauk SSSR 72, 53 (1950).

4. B. K. Vainshtein, Dokl. Akad. Nauk SSSR 99(1), 81 (1954).

5. D. L. Dorset, Structural Electron Crystallography (Plenum, New York, 1995).

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