Calculating the high-frequency electrical conductivity of a thin semiconductor film for different specular reflection coefficients of its surface-Reference-Cited by-同舟云学术

Calculating the high-frequency electrical conductivity of a thin semiconductor film for different specular reflection coefficients of its surface

Published:2017-07 Issue:4 Volume:46 Page:252-260
ISSN:1063-7397
Container-title:Russian Microelectronics
language:en
Short-container-title:Russ Microelectron

Author:

Kuznetsova I. A.,Romanov D. N.,Savenko O. V.,Yushkanov A. A.

Publisher

Pleiades Publishing Ltd

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1063739717040059.pdf

Reference14 articles.

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2. Shusterman, Y.V., Yakovlev, N.L., and Schowalter, L.J., Appl. Surf. Sci., 2001, vol. 175, pp. 27–32.

3. Harrison, W., Solid State Theory, New York: Dover, 1989.

4. Anselm, A.I., Introduction to Semiconductor Theory, Englewood Cliffs, NJ: Prentice Hall, 1982.

5. Lifshits, I.M., Azbel, M.Ya., and Kaganov, M.I., Elektronnaya teoriya metallov (Electron Theory of Metals), Moscow: Nauka, 1971; New York: Plenum, 1973.

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