ARIMA models used to predict the time to degradation failure of TTL ICs-Reference-Cited by-同舟云学术

ARIMA models used to predict the time to degradation failure of TTL ICs

Published:2007-07 Issue:4 Volume:36 Page:261-270
ISSN:1063-7397
Container-title:Russian Microelectronics
language:en
Short-container-title:Russ Microelectron

Author:

Gorlov M. I.,Strogonov A. V.

Publisher

Pleiades Publishing Ltd

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1063739707040063.pdf

Reference10 articles.

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3. Box, G.E.P. and Jenkins, G.M., Time Series Analysis: Forecasting and Control, San Francisco: Holden-Day, 1970.

4. Handbook of Applicable Mathematics, Ledermann, W., Ed., vol. 6: Statistics, Chichester: Wiley, 1984.

5. Borovikov, V.P. and Ivchenko, G.I., Prognozirovanie v sisteme STATISTICA v srede Windows. Osnovy teorii i intensivnaya praktika na komp’yutere (Forecasting with Statistica for Windows: Principles and Intensive PC Course), Moscow: Finansy i Statistika, 1999.

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