Author:
Antonova A. O.,Savyolova T. I.
Subject
Computational Mathematics
Reference25 articles.
1. A. J. Schwartz, M. Kumar, B. L. Adams, and D. P. Field, Electron Backscatter Diffraction in Materials Science, 2nd. ed. (Springer, New York, 2009).
2. V. N. Danilenko, S. Yu. Mironov, A. N. Belyakov, and A. P. Zhilyaev, “Application of EBSD analysis in material science (overview),” Zavod. Lab. Diagn. Mater. 78(2), 28–46 (2012).
3. F. J. Humphreys, “Grain and subgrain characterization by electron backscatter diffraction,” J. Mater. Sci. 36, 3833–3854 (2001).
4. S. Yu. Mironov, V. N. Danilenko, M. M. Myshlyaev, and A. V. Korneva, “Analysis of the spatial orientation distribution of building blocks in polycrystalline as determined using transmission electron microscopy and a back-scattered electron beam in a scanning electron microscope,” Phys. Solid State 47(7), 1258–1266 (2005).
5. G. Gottstein, Physical Foundations of Material Science (Springer, New York, 2004; Binom, Moscow, 2009).
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献