Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon

Author:

Bogdanov O. V.,Korotchenko K. B.,Pivovarov Yu. L.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Comparison of the quantum and classical calculations of flux density of (220) channeled positrons in Si crystal;Journal of Physics: Conference Series;2016-07

2. Quantum theory of X-ray radiation at Bragg angles at channeling;Radiation Physics and Chemistry;2015-04

3. Channeling and parametric X-ray studies at the SAGA Light Source;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-11

4. Angular distributions of Diffracted Channeling Radiation from moderate energy axially channeled electrons in Si and LiF crystals;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2011-12

5. Diffracted channeling radiation for axial electron channeling;Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques;2010-10

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