On the problems of the application of atomic-force microscopes for studying the surface roughness of elements for imaging optics-Reference-Cited by-同舟云学术

On the problems of the application of atomic-force microscopes for studying the surface roughness of elements for imaging optics

Published:2013-07 Issue:4 Volume:7 Page:797-801
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Barysheva M. M.,Gribkov B. A.,Zorina M. V.,Salashchenko N. N.,Chkhalo N. I.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

Reference12 articles.

1. R. Blunt, in Proceedings of the SEMANTECH Conference (Vancouver, Canada, 2006), p. 59.

3. A. V. Biryukov, S. V. Gaponov, B. A. Gribkov, M. V. Zorina, V. L. Mironov, and N. N. Salashchenko, Poverkhnost’, No. 2, 17 (2003).

5. M. S. Bibishkin, S. Yu. Zuev, N. N. Salashchenko, and N. I. Chkhalo, Poverkhnost’, No. 1, 94 (2003).

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