Measurement of the diffusion length and the lifetime of free excitons in gallium nitride using cathodoluminescence under different conditions of luminescence excitation-Reference-Cited by-同舟云学术

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Measurement of the diffusion length and the lifetime of free excitons in gallium nitride using cathodoluminescence under different conditions of luminescence excitation

Published:2015-07 Issue:4 Volume:9 Page:839-843
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Nikiforova N. A.,Stepovich M. A.,Mikheev N. N.,Hocker M.,Tischer I.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S102745101504031X.pdf

Reference20 articles.

1. D. B. Wittry and D. F. Kyser, J. Appl. Phys. 38, 375 (1967).

2. T. S. Rao-Sahib and D. B. Wittry, J. Appl. Phys. 40, 3745 (1969).

3. N. N. Mikheev, Sov. Phys. Semicond. 21, 226 (1987).

4. N. N. Mikheev, I. M. Nikonorov, V. I. Petrov, M. A. Stepovich, Bull. Acad. Sci. USSR: Phys. 54, 82 (1990).

5. N. N. Mikheev, I. M. Nikonorov, V. I. Petrov, M. A. Stepovich, and V. Al Shaer, Bull. Acad. Sci. USSR: Phys. 54, 75 (1990).

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1. Identification of the Diffusion Length in Gallium Nitride by Cathodoluminescence in Cases of the Exciton Recombination and Impurity Recombination of Nonequilibrium Charge Carriers;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2019-01

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