Study of resonant tunneling in Au nanoclusters on the surface of SiO2/Si thin films using the combined scanning tunneling microscopy and atomic-force microscopy technique-Reference-Cited by-同舟云学术

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Study of resonant tunneling in Au nanoclusters on the surface of SiO2/Si thin films using the combined scanning tunneling microscopy and atomic-force microscopy technique

Published:2009-08 Issue:4 Volume:3 Page:559-565
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Lapshina M. A.,Filatov D. O.,Antonov D. A.,Barantsev N. S.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451009040132.pdf

Reference22 articles.

1. C. Binns, Surf. Sci. Rep. 44(1), 1 (2001).

2. E. Cattaruzza, G. Battaglin, F. Gonella, et al., Philos. Mag. 76(4), 615 (2002).

3. V. P. Dragunov, I. G. Neizvestnyi, and V. A. Gridchin, The Bases of Nanoelectronics (Novosib. Gos. Tekh. Univ., Novosibirsk, 2000) [in Russian].

4. G. F. Cerofolini, G. Arena, M. Camalleri, et al., Microelectron. Eng. 81(2–4), 405 (2005).

5. S. Tiwary, F. Rana, K. Chan, et al., Appl. Phys. Lett. 69(9), 1232 (1996).

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5. Resonant tunnelling through individual Au nanoclusters embedded in ultrathin SiO2films studied by Tunnelling AFM;Journal of Physics: Conference Series;2010-09-01

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