On the influence of a high-power ion beam on thin polymer layers deposited onto dielectric substrates
Author:
Publisher
Pleiades Publishing Ltd
Subject
Surfaces, Coatings and Films
Link
http://link.springer.com/content/pdf/10.1134/S1027451016020270.pdf
Reference7 articles.
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4. J. Goldstein, D. Newbury, P. Echlin, et al., Scanning Electron Microscopy and X-ray Microanalysis (Kluwer, New York, 2003).
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