Effects of spatial ordering of quantum dot arrays from small-angle X-ray diffraction data under variation of growth parameters

Author:

Plyasova L. M.,Molina I. Yu.,Stepina N. P.,Zinov’eva A. F.,Dvurechenskii A. V.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Reference14 articles.

1. D. K. Bowen and B. K. Tanner, High Resolution X-ray Diffractometry and Topography (Taylor Francis, London, 1998; Nauka, St.-Petersburg, 2002), p. 31.

2. U. Pietsch, V. Holy, and T. Baumbach, High Resolution X-Ray Scattering: from Thin Films To Lateral Nanostructures (Springer, New York, 2004).

3. Methods of Investigation of Atomic Structure and Substructure of Materials, The School-book, Ed. by V. M. Ievlev (Gos. tekhn. Univ., Voronezh, 2003), p. 126 [in Russian].

4. V. Holy, J. Strangl, T. Fromherz, et al., Phys. Rev. B 79, 035324 (2009).

5. V. I. Iveronova and G. P. Revkevich, in Theory of X-Ray Scattering (Mosk. Gos. Univ., Moscow, 1978), p. 129 [in Russian].

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