1. Fainer, N.I., Kosinova, M.L., and Rumyantsev, Yu.M., Ross. Khim. Zh., 2001, vol. 45, no. 3, p. 101.
2. Bubert, H. and Jenett, H., Surface and Thin Film Analysis: Principles, Instrumentation, Application, Wiley, 2002.
3. Bezrukov, V.V., Gur’yanov, M.A., and Kovalev, I.D., Mass-spektrometria, 2005, vol. 2, no. 1, p. 45.
4. Kovalev, I.D., Malyshev, K.N., and Shmonin, P.A., J. Anal. Chem., 1998, vol. 53, no. 3, p. 269.
5. Bezrukov, V.V., Kovalev, I.D., and Malyshev, K.N., J. Anal. Chem., 2002, vol. 57, no. 4, p. 318.