Analysis of inherent potential nonuniformities at the extrinsic-semiconductor surface-Reference-Cited by-同舟云学术

Analysis of inherent potential nonuniformities at the extrinsic-semiconductor surface

Published:2001-08 Issue:8 Volume:35 Page:927-931
ISSN:1063-7826
Container-title:Semiconductors
language:en
Short-container-title:Semiconductors

Author:

Bondarenko V. B.,Kuz’min M. V.,Korablev V. V.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/1.1393029.pdf

Reference9 articles.

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2. S. G. Dmitriev and Sh. M. Kogan, Fiz. Tverd. Tela (Leningrad) 21(1), 29 (1979) [Sov. Phys. Solid State 21, 17 (1979)].

3. D. Arnold and K. Hess, J. Appl. Phys. 61(11), 5178 (1987).

4. J. H. Davies and J. A. Nixon, Phys. Rev. B 39(5), 3423 (1989).

5. V. B. Bondarenko, Yu. A. Kudinov, S. G. Ershov, and V. V. Korablev, Fiz. Tekh. Poluprovodn. (St. Petersburg) 30(11), 2068 (1996) [Semiconductors 30, 1078 (1996)].

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