Diagnostics of nanostructured states of materials after strong external exposures by atom probe methods of field ion microscopy

Author:

Ivchenko V. A.

Publisher

Pleiades Publishing Ltd

Subject

Materials Chemistry,Metals and Alloys,Inorganic Chemistry,General Chemical Engineering

Reference21 articles.

1. Muller, E.V., Field Ionization and Field-Ion Microscopy, Phys. Usp., 1962, vol. 77, pp. 481–552.

2. Gomer, R., Kataliz i elektronnye yavleniya (Catalysis and Electronic Phenomena), Moscow: Inostrannaya Literatura, 1958.

3. Müller, E.W. and Tsong, T.T., Field Ion Microscopy, New York: Elsevier, 1969.

4. Miller, M.K. and Smith G.D.W., Atom Probe Microanalysis: Principles and Applications to Materials Problems, Pittsburgh: Material Research Society, 1989.

5. Tsong, T.T. Atom-Probe Field Ion Microscopy. Field Ion Emission and Surfaces and Interfaces at Atomic Resolution, Cambridge: Cambridge Univ. Press, 1990, p. 387.

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