Application of electron microscopy and x-ray structural analysis for the determination of sizes of structural elements in nanocrystalline materials (Review)

Author:

Yagodkin Yu. D.,Dobatkin S. V.

Publisher

Pleiades Publishing Ltd

Subject

Materials Chemistry,Metals and Alloys,Inorganic Chemistry,General Chemical Engineering

Reference46 articles.

1. Gusev, A.I. and Rempel’, A.A., Nanocristallicheskie materialy (Nanocrystalline Materials), Moscow: Fizmatlit, 2002.

2. Valiev, R.Z. and Aleksandrov, I.V., Nanostrukturnye materialy, poluchennye intensivnoi plasticheskoi deformatsiei (Nanostructured Materials Obtained by Intense Plastic Deformation), Moscow: Logos, 2000.

3. Pool, C.P. and Owens, F.J., Introduction to Nanotechnology, Hoboken, NJ: Wiley, 2003.

4. Umanskii, Ya.S., Skakov, Yu.A., Ivanov, A.N., and Rastorguev, L.N., Kristallografiya, rentgenografiya i elektronnaya mikroskopiya (Crystallography, x-Ray Diffractometry, and Electron Microscopy), Moscow: Metallurgiya, 1982.

5. Iveronova, V.I. and Katsnel’son, G.P., Teoriya rasseyaniya rentgenovskikh luchei (Theory of x-Ray Scattering), Moscow: MGU, 1972.

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