X-ray fluorescence analysis of the composition of As-Ge-Se glasses and films-Reference-Cited by-同舟云学术

X-ray fluorescence analysis of the composition of As-Ge-Se glasses and films

Published:2011-03 Issue:3 Volume:37 Page:250-252
ISSN:1063-7850
Container-title:Technical Physics Letters
language:en
Short-container-title:Tech. Phys. Lett.

Author:

Bordovskii G. A.,Gladkikh P. V.,Eremin I. V.,Marchenko A. V.,Seregin P. P.,Smirnova N. N.,Terukov E. I.

Publisher

Pleiades Publishing Ltd

Subject

Physics and Astronomy (miscellaneous)

Link

http://link.springer.com/content/pdf/10.1134/S1063785011030199.pdf

Reference2 articles.

1. G. A. Bordovskii, A. V. Marchenko, P. P. Seregin, N. N. Smirnova, and E. I. Terukov, Pis’ma Zh. Tekh. Fiz. 35(22), 15 (2009) [Tech. Phys. Lett. 35, 1032 (2009)].

2. G. A. Bordovsky, A. V. Marchenko, P. P. Seregin, N. N. Smirnova, and E. I. Terukov, Fiz. Tekh. Poluprovodn. (St. Patersburg) 44, 26 (2010) [Semiconductors 44, 24 (2010)].

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