Study of the relationship between the crystal structure of nanolayers and electrical properties in Al x Ga1−x As/In y Ga1−y As pseudobinary heterostructures by double-crystal X-ray diffraction-Reference-Cited by-同舟云学术

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Study of the relationship between the crystal structure of nanolayers and electrical properties in Al x Ga1−x As/In y Ga1−y As pseudobinary heterostructures by double-crystal X-ray diffraction

Published:2008-03 Issue:2 Volume:53 Page:183-186
ISSN:1063-7745
Container-title:Crystallography Reports
language:en
Short-container-title:Crystallogr. Rep.

Author:

Imamov R. M.,Subbotin I. A.,Galiev G. B.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1134/S106377450802003X.pdf

Reference6 articles.

1. C. Gaquire, J. Grünenütt, D. Jambn, et al., IEEE Electron Device Lett. 26(8), 533 (2005).

2. A. M. Afanas’ev and R. M. Imamov, Kristallografiya 48(5), 786 (2003) [Crystallogr. Rep. 48, 728 (2003)].

3. S. N. Yakunin, É. M. Pashaev, A. A. Zaĭtsev, et al., Mikroelektronika 34(4), 1 (2005).

4. X. Cao, Y. Zheng, M. Kong, et al., J. Cryst. Growth 227–228, 127 (2001).

5. G. B. Galiev, I. S. Vasilevskiĭ, E. A. Klimov, et al., Fiz. Tekh. Poluprovodn. (St. Petersburg) 40(12), 1479 (2006) [Semiconductors 40, 1445 (2006)].

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-ray diagnostics of semiconductor heterostructures: Some achievements and perspectives for development;Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques;2010-02

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