X-ray diffraction study of a Nd3Ga5SiO14 crystal at 295 and 90 k and the structural basis for chirality-Reference-Cited by-同舟云学术

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X-ray diffraction study of a Nd3Ga5SiO14 crystal at 295 and 90 k and the structural basis for chirality

Published:2014-09 Issue:5 Volume:59 Page:689-698
ISSN:1063-7745
Container-title:Crystallography Reports
language:en
Short-container-title:Crystallogr. Rep.

Author:

Dudka A. P.,Mill’ B. V.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1134/S1063774514050034.pdf

Reference43 articles.

1. A. P. Dudka, B. V. Mill’, and Yu. V. Pisarevskii, Crystallogr. Rep. 54(4), 558 (2009).

2. E. L. Belokoneva and N. V. Belov, Dokl. Akad. Nauk SSSR, 260(6), 1363 (1981).

3. B. V. Mill and Yu. V. Pisarevsky, Proc. IEEE/EIA Intern. Frequency Control Symp., Kansas City, Missouru, USA, 2022, p. 133.

4. A. A. Kaminsky, B. V. Mill’, S. E. Sarkisov, et al., Physics and Spectroscopy of Laser Crystals (Nauka, Moscow, 1986) [in Russian], p. 197.

5. K. Marty, P. Bordet, V. Simonet, et al., Phys. Rev. B 81, 054416 (2010).

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