Trajectory method in the theory of Laue diffraction of X rays in crystals: II. Effect of total reflection at bending deformation-Reference-Cited by-同舟云学术

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Trajectory method in the theory of Laue diffraction of X rays in crystals: II. Effect of total reflection at bending deformation

Published:2008-03 Issue:2 Volume:53 Page:177-182
ISSN:1063-7745
Container-title:Crystallography Reports
language:en
Short-container-title:Crystallogr. Rep.

Author:

Kohn V. G.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1134/S1063774508020028.pdf

Reference11 articles.

1. V. G. Kohn, Kristallografiya 52(4), 625 (2007) [Crystallogr. Rep. 52, 598 (2007)].

2. A. P. Mkrtchan, M. A. Navasardyan, and V. K. Mirzoyan, Pis’ma Zh. Tekh. Fiz. 8, 677 (1982) [Sov. Tech. Phys. Lett. 8, 294 (1982)].

3. M. A. Navasardyan, J. Appl. Crystallogr. 34, 763 (2001).

4. Z. G. Pinsker, X-ray Crystal Optics (Nauka, Moscow, 1982) [in Russian].

5. A. Autier, Dynamical Theory of X-ray Diffraction (Oxford Univ. Press, New York, 2001).

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