1. Nanotechnologies in Electronics, Ed. by Yu. A. Chaplygin (Tekhnosfera, Moscow, 2015), No. 3 [in Russian].
2. V. L. Mironov, Principles of Scanning Probe Microscopy (Tekhnosfera, Moscow, 2004) [in Russian].
3. Yu. A. Chaplygin and V. I. Shevyakov, “Investigation into the effect of cantilever structural parameters on the sensitivity of magnetic force microscopy,” Nanotechnol. Russ. 8, 186 (2013).
4. S. Yu. Krasnoborodko, A. B. Shubin, V. I. Shevyakov, et al., Mikroelektronika 40 (7), 93–96 (2011).
5. S. Yu. Krasnoborodko, S. A. Smagulova, Yu. A. Chaplygin, and V. I. Shevyakov, “Modification of cantilevers for atomic-force microscopy using the method of exposure defocused ion beam,” Proc. SPIE 9440, 94400 (2014).