1. R. Wiesendanger and H.-J. Guntherodt, Scanning Tunneling Microscopy: II. Further Applications and Related Scanning Techniques (Springer, Berlin, 1993).
2. A. A. Bukharaev, N. I. Nurgazizov, A. A. Mozhanova, and D. V. Ovchinnikov, “AFM Investigation of Selective Etching Mechanism of Nanostructured Silica,” Surf. Sci. 482(5), 1319–1324 (2001).
3. A. A. Bukharaev, N. V. Berdunov, D. V. Ovchinnikov, and K. M. Salikhov, “Atomic Force Microscopy for Metrology of Micro- and Nanostructures,” Mikroelektronika 26(3), 163–175 (1997) [Russ. Microelectron. 26 (3), 137–148 (1997)].
4. V. I. Bukhtiyarov, “Modern Trends in the Development of the Surface Science as Applied to Catalysis: The Elucidation of the Structure-Activity Relationships in Heterogeneous Catalysts,” Usp. Khim. 76(6), 596–627 (2007).
5. S. A. Ziganshina, A. P. Chuklanov, A. A. Bukharaev, L. G. Shaidarova, I. A. Chelnokova, A. V. Gedmina, and G. K. Budnikov, “Investigation of Multiphase Nanostructures with an Atomic-Force Microscope Operating in the Phase Contrast Mode,” Poverkhnost, No. 2, 18 (2006).