1. K. H. J. Buschow, Rep. Prog. Phys. 54, 1123 (1991).
2. H. Kronmuller, K. D. Durst, and M. Sagawa, J. Magn. Magn. Mater. 74, 291 (1988).
3. A. S. Bakai, V. B. Kulko, I. M. Mikhailovskij et al., J. Phys.: Condens. Matter 182, 315 (1995).
4. A. Modinos, Field, Thermal, and Secondary Electron Emission Spectroscopy [in Russian], Nauka, Moscow (1990).
5. M. Miller and G. Smith, Probe Analysis in Field Ion Microscopy [Russian transl.] Mir, Moscow (1993).