Measurement of spectral directional emissivity of materials and coatings in the infrared region of spectrum
Author:
Publisher
Pleiades Publishing Ltd
Subject
Energy Engineering and Power Technology,Nuclear Energy and Engineering
Link
http://link.springer.com/content/pdf/10.1134/S0040601509030100.pdf
Reference10 articles.
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2. J. T. Bevans and D. K. Edwards, “Radiation Exchange in an Enclosure with Directional Wall Properties,” Heat Transfer. Ser. C, No. 3, 388–396 (1965).
3. L. del Campo, R. B. Perez-Saez, X. Esquisabel, et al., “New Experimental Device for Infrared Spectral Directional Emissivity Measurements in a Controlled Environment,” Rev. Scient. Instrum., 77(11), 113111-1–113111-8 (2006).
4. T. Furukawa and T. Iuchi, “Experimental Apparatus for Radiometric Emissivity Measurements of Metals,” Rev. Scient. Instrum., 71(7), 2843–2847 (2000).
5. D. F. Takeuti, P. J. Timans, and H. Ahmed, “Emissivity of B-Implanted and Annealed Silicon,” Appl. Phys. Lett., 67(15), 2206–2208 (1995).
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