Author:
Li Wei,Li Qing,He Keda,Liu Lei
Reference16 articles.
1. Mishra, J.P., Xu, Q., Yu, X., and Jalili, M., IEEE/ASME Trans. Mechatron., 2018, vol. 23, no. 4, p. 1521. https://ieeexplore.ieee.org/document/8408559.
2. Baiburin, V.B., Volkov, Y.P., and Konnov, N.P., Instrum. Exp. Tech., 1998, vol. 41, no. 2, p. 277.
3. Mikhailov, V.P. and Bazinenkov, A.M., Instrum. Exp. Tech., 2016, vol. 59, no. 1, p. 131. https://doi.org/10.1134/S0020441216010085
4. Habibulla, H., Pota, H.R., Petersen, I.R., and Rana, M.S., IEEE Trans. Nanotechnol., 2013, vol. 12, no. 6, p. 1125. https://ieeexplore.ieee.org/document/6589158.
5. Guo, C., Lu, D., Zhang, M., Zhang, Q., and Chen, C., Aerospace Sci. Technol., 2020, vol. 106, p. 106148. https://doi.org/10.1016/j.ast.2020.106148