Modern Application-Specific Integrated Circuits for Resistive Plate Chambers (Review)
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Published:2022-12
Issue:6
Volume:65
Page:865-877
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ISSN:0020-4412
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Container-title:Instruments and Experimental Techniques
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language:en
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Short-container-title:Instrum Exp Tech
Publisher
Pleiades Publishing Ltd
Reference10 articles.
1. Toker, O., Masciocchi, S., Nygard, E., Rudge, A., and Weilhammer, P., Nucl. Instrum. Methods Phys. Res.,
Sect. A, 1994, vol. 340, p. 572. https://doi.org/10.1016/0168-9002(94)90140-6 2. Giannini, F., Limiti, E., Orengo, G., and Cardarelly, R., Nucl. Instrum. Methods Phys. Res.,
Sect. A, 1999, vol. 432, p. 440. https://doi.org/10.1016/S0168-9002(99)00376-9 3. Anghinolfi, F., Jarron, P., Martemyanov, A.N., Usenko, E., Wenninger, H., Williams, M.C.S., and Zichichi, A., Nucl. Instrum. Methods Phys. Res.,
Sect. A, 2004, vol. 533, p. 183. https://doi.org/10.1016/j.nima.2004.07.024 4. Ciobanu, M., Herrmann, N., Hildenbrand, K.D., Kiš, M., Schüttauf, A., Flemming, H., Deppe, H., Löchner, S., Frühauf, J., Deppner, I., Loizeau, P.-A., and Träger, M., IEEE Trans. Nucl. Sci., 2007, vol. 54, no. 4, p. 1201. https://doi.org/10.1109/TNS.2007.903186 5. Art Kay, Operational Amplifier Noise: Techniques and Tips for Analyzing and Reducing Noise, Newnes, 2012.
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