1. Volodin, A.P., Prib. Tekh. Eksp., 1998, no. 6, p. 3 [Instum. Exp. Tech. (Engl. Transl.), 1998, no. 6, p. 745]; www.nanoworld.org.
2. Gutroff, G., Bayer, M., Forchel, A., et al., Pis’ma Zh. Eksp. Teor. Fiz., 1997, vol. 66, no. 7, p. 497 [JETP Lett. (Engl. Transl.), 1997, vol. 66, no. 7, p. 528].
3. Khlyustikov, I.N. and Edel’man, V.S., Prib. Tekh. Eksp., 1996, no. 1, p. 158 [Instum. Exp. Tech. (Engl. Transl.), 1996, no. 1, p. 143].
4. Brown, K.R., Sun, L., and Kane, B.E., Rev. Sci. Instrum., 2004, vol. 75, no. 6, p. 2029.
5. www.omicron.de; www.nanonics.com.il.