The lifetime of a high-current triggered vacuum switch with multi-gap
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Published:2014-05
Issue:3
Volume:57
Page:296-299
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ISSN:0020-4412
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Container-title:Instruments and Experimental Techniques
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language:en
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Short-container-title:Instrum Exp Tech
Author:
Zhou Zhengyang,Zhao Liang,Chen Jingwei,Dong Li
Publisher
Pleiades Publishing Ltd
Reference18 articles.
1. Zhou, J.Y. and Con, J.Y., Proc. 19th ISDEIV, Xi’an, 2000, p. 192. 2. Zou, J.Y., Chen, J.X., and Lin, Q.W., Proc. 19th ISDEIV, Xi’an, 2000, p. 363. 3. He, J.J. and Zou, J.Y., IEEE Trans. on Magnetics, 1999, vol. 35, p. 352. 4. Lee, H.S., Jin, Y.S., Kim, J.S., Cho, C.H., Rim, G.H., Kim, J.S., Chu, J.H., Jung, J.W., Sidorov, V.A., and Alferov, D.F., IEEE Trans. Magn., 2001, vol. 37, p. 371. 5. Zhao, C., Zou, J.Y., Li, X.P., Liao, M.F., Zhou, Z.Y., and Wang, Y.F., IEEE Trans. Magn., 2007, vol. 43, p. 219.
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