Application of a Differential Polarization Interferometer for Measuring of the Optical Path Length in Thin Metamaterial Layers with Reflection and Absorption Losses-Reference-Cited by-同舟云学术

Application of a Differential Polarization Interferometer for Measuring of the Optical Path Length in Thin Metamaterial Layers with Reflection and Absorption Losses

Published:2019-08-06 Issue:4 Volume:62 Page:532-536
ISSN:0020-4412
Container-title:Instruments and Experimental Techniques
language:en
Short-container-title:Instrum Exp Tech

Author:

Agashkov A. V.,Kazak N. S.

Publisher

Pleiades Publishing Ltd

Subject

Instrumentation

Link

http://link.springer.com/content/pdf/10.1134/S0020441219040018.pdf

Reference15 articles.

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3. Foteinopoulou, S. and Soukoulis, C.M., Phys. Rev. B, 2003, vol. 67, no. 23, p. 235107-1. https://doi.org/10.1103/PhysRevB.67.235107

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