Study of Extended Electrically Active Defects in Heterostructures Based on (Ga,Mn)As/(In,Ga)As by Electron Beam-Induced Current and Deep-Level Transient Spectroscopy-Reference-Cited by-同舟云学术

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Study of Extended Electrically Active Defects in Heterostructures Based on (Ga,Mn)As/(In,Ga)As by Electron Beam-Induced Current and Deep-Level Transient Spectroscopy

Published:2019-01 Issue:1 Volume:13 Page:105-110
ISSN:1027-4510
Container-title:Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Soltanovich O. A.,Kovalskiy V. A.,Vergeles P. S.,Dorokhin M. V.,Danilov Yu. A.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451019010336.pdf

Reference24 articles.

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2. O. Yastrubchak, T. Wosinski, J. Z. Domagala, et al., J. Phys.: Condens. Matter 16 (2), S1 (2004). https://doi.org/10.1088/0953-8984/16/2/001

3. E. A. Fitzgerald, Y.-H. Xie, D. Monroe, et al., J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct. 10 (4), 1807 (1992). https://doi.org/10.1116/1.586204

4. M. Albrecht, S. Christiansen, J. Michler, et al., Appl. Phys. Lett. 67 (9), 1232 (1995). https://doi.org/10.1063/1.115017

5. M. A. Lutz, R. M. Feenstra, F. K. LeGoues, et al., Appl. Phys. Lett. 66 (6), 724 (1995). https://doi.org/10.1063/1.114112

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1. Segregación de Mn en películas delgadas de GaAsMn obtenidas mediante pulverización catódica;Matéria (Rio de Janeiro);2020

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