Application of XAFS spectroscopy to studying the microstructure and electronic structure of quantum dots-Reference-Cited by-同舟云学术

Application of XAFS spectroscopy to studying the microstructure and electronic structure of quantum dots

Published:2007-02 Issue:1 Volume:1 Page:26-34
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Erenburg S. B.,Bausk N. V.,Dvurechenskii A. V.,Smagina Zh. V.,Nenashev A. V.,Nikiforov A. I.,Mansurov V. G.,Zhuravlev K. S.,Toropov A. I.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

Reference10 articles.

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2. S. B. Erenburg, N. V. Bausk, A. V. Nenashev, et al., Zh. Strukt. Khim. 42, 890 (2000).

4. N. Binsted, J. W. Campbell, S. J. Gurman, and P. C. Stephenson, SERC Daresbury Lab. Rep (1991).

5. A. V. Dvurechenskii, V. A. Zinovjev, V. A. Kudryavtsev, and Zh. V. Smagina, Pisma Zh. Eksp. Teor. Fiz. 72, 190 (2000) [JETP Lett. 72, 131 (2000)].

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