X-ray photoelectron and auger spectroscopy analysis of Ge:Mn-based magnetic semiconductor layers-Reference-Cited by-同舟云学术

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X-ray photoelectron and auger spectroscopy analysis of Ge:Mn-based magnetic semiconductor layers

Published:2008-08 Issue:4 Volume:2 Page:541-545
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Demidov E. S.,Zubkov S. Yu.,Lesnikov V. P.,Maksimov G. A.,Nikolichev D. E.,Podol’skii V. V.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451008040083.pdf

Reference5 articles.

1. X. H. Zhou, X. S. Chen, and X. G. Guo, J. Magn. Magn. Mater. 284, 353 (2004).

2. E. S. Demidov, Yu. A. Danilov, V. V. Podolskii, et al., Pisma Zh. Eksp. Teor. Fiz. 83(12), 664 (2006) [JETP Lett. 83, 568 (2006)].

3. Yu. A. Danilov, E. S. Demidov, and Yu. N. Drozdov, Fiz. Tekh. Poluprovodn. 39(1), 8 (2005) [Semiconductors 39, 4 (2005)].

4. M. Menyhard, A. Barna, J. P. Biersack, et al., J. Vac. Sci. Technol. A 13(4), 1999 (1995).

5. Digital Databases of XPS Spectra, XPS International, www.xpsdata.com.

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