AES and XPS studies of a por-Si/SnOx nanocomposite formed using a powerful ion beam of nanosecond duration-Reference-Cited by-同舟云学术

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AES and XPS studies of a por-Si/SnOx nanocomposite formed using a powerful ion beam of nanosecond duration

Published:2013-01 Issue:1 Volume:7 Page:62-66
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Bolotov V. V.,Knyazev E. V.,Kovivchak V. S.,Korepanov A. A.,Korusenko P. M.,Nesov S. N.,Porovoznyuk S. N.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451013010060.pdf

Reference17 articles.

1. S. Borini, J. Appl. Phys. 102(093), 709 (2007).

2. G. Amato, L. Boarino, and F. Bellotti, Appl. Phys. Lett. 85, 4409 (2004).

3. Z. Gaburro, C. J. Oton, L. Pavesi, and L. Pancheri, Appl. Phys. Lett. 84, 4388 (2004).

4. H. Meixner and U. Lampe, Sensors Actuat. B 33, 198 (1996).

5. K. Kalantar-zadeh and B. Fry, Nanotechnology-Enabled Sensors (Springer Science+Business Media, New York, 2008).

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Structure and composition of chemically deposited In2S3 thin films;Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques;2014-07

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