X-ray interferometry study of deformation fields in silicon crystals, induced by a constant magnetic field-Reference-Cited by-同舟云学术

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X-ray interferometry study of deformation fields in silicon crystals, induced by a constant magnetic field

Published:2013-11 Issue:6 Volume:7 Page:1056-1059
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Drmeyan G. R.,Aboyan A. O.,Movcicyan A. A.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451013060062.pdf

Reference11 articles.

1. P. A. Bezirganyan and V. I. Avundzhyan, Izv. AN Arm SSR, Fiz. 1, 147 (1966).

2. A. O. Aboyan and G. R. Drmeyan, Vestn. Inzh. Akad. Arm. 6, 269 (2009).

3. V. I. Iverenova and G. P. Revkevich, Theory of X-Ray Scattering (Mosk. Gos. Univ., Moscow, 1972) [in Russian].

4. Z. G. Pinsker, X-ray Crystal Optics (Nauka, Moscow, 1982) [in Russian].

5. H. R. Drmeyan, Crystallogr. Rep. 50, 363 (2005).

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