Influence of the surface microroughness of a Si(001) substrate on the morphology of CaF2 epitaxial layers under high-temperature growth conditions-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Influence of the surface microroughness of a Si(001) substrate on the morphology of CaF2 epitaxial layers under high-temperature growth conditions

Published:2013-05 Issue:3 Volume:7 Page:488-492
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Velichko A. A.,Ilyushin V. A.,Filimonova N. I.,Katsyuba A. V.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451013030166.pdf

Reference12 articles.

1. V. N. Mordkovich, Mater. Elektron. Tekh., No. 2, 4 (1998).

2. A. A. Velichko, V. A. Ilyushin, D. I. Ostertak, Yu. G. Peisakhovich, and N. I. Filimonova, J. Surf. Invest. 1, 479 (2007).

3. A. A. Altukhov and A. Yu. Mityagin, Russ. Microelectronics 30, 94 (2001).

4. A. A. Velichko, V. A. Ilyushin, Yu. G. Peisakhovich, and A. A. Shtyganov, RF Patent No. 2300855, Byull. Izobret. No. 18 (2007).

5. A. A. Velichko, Doctoral Dissertation in Technical Sciences (NNovg. State Technol. Univ., Nizh. Novgorod, 1999), p. 372.

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effect of Substrate on the Photoluminescence Spectra of CaF2/Si Multilayer Structures;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2023-08

2. High accuracy and transferability of a neural network potential through charge equilibration for calcium fluoride;Physical Review B;2017-03-16

3. Study of the features of BaF2 heteroepitaxy on CaF2/Si(100) layers obtained in the high-temperature growth mode;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2017-01

4. Features of the surface morphology of CaF2/Si(100) films obtained by solid-phase epitaxy;Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques;2016-11

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3