Electron Microscopic Study of the Influence of Annealing on Ge–Sb–Te Thin Films Obtained by Vacuum Thermal Evaporation-Reference-Cited by-同舟云学术

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Electron Microscopic Study of the Influence of Annealing on Ge–Sb–Te Thin Films Obtained by Vacuum Thermal Evaporation

Published:2019-09 Issue:5 Volume:13 Page:962-966
ISSN:1027-4510
Container-title:Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Sybina Yu. S.,Borgardt N. I.,Lazarenko P. I.,Parsegova V. S.,Prikhodko A. S.,Sherchenkov A. A.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451019050380.pdf

Reference26 articles.

1. Phase Change Memory, Ed. by A. Redaelli (Springer International, Cham, 2018). https://doi.org/10.1007/978-3-319-69053-7

2. S. A. Kozyukhin, A. A. Sherchenkov, V. M. Novotortsev, and S. P. Timoshenkov, Nanotechnol. Russia 6, 227 (2011).

3. T. H. Jeong, M. R. Kim, H. Seo, et al., J. Appl. Phys. 86 (2), 774 (1999). https://doi.org/10.1063/1.370803

4. P. Kumar, S. K. Tripathi, and I. Sharma, J. Alloys Compd. 755, 108 (2015). https://doi.org/10.1016/j.jallcom.2018.04.316

5. M. Schuck, S. Ries, M. Schreiber, et al., J. Cryst. Growth 420, 37 (2015). . https://doi.org/10.1016/j.jcrysgro.2015.03.034

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