Quantum size effect observed during the small-angle reflection of an electron beam incident onto a single-crystal film with allowance for the average internal lattice potential-Reference-Cited by-同舟云学术

Quantum size effect observed during the small-angle reflection of an electron beam incident onto a single-crystal film with allowance for the average internal lattice potential

Published:2017-05 Issue:3 Volume:11 Page:650-659
ISSN:1027-4510
Container-title:Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Shkornyakov S. M.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451017030351.pdf

Reference7 articles.

1. S. M. Shkornyako., J. Surf. Invest.: X-ra., Synchrotron Neutron Tech. 7 (1), 187 (2013).

2. D. S. Saxon and R. A. Hutne., Philips Res. Rep. 4 (2), 81 (1949).

3. S. M. Shkornyakov, M. L. Salnikov, and S. A. Semileto., Sov. Phys. Solid State 19 (3), 398 (1977).

4. S. M. Shkornyako., Poverkhnost., No. 9, 6 (2002).

5. E. Aerts, in Solid State Physics in Electronics and Telecommunications (Academic Press, London, New York, 1960), Vol. 1, p.678.

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