On the technique of absolutization of diffuse scattering intensity measurements based on thermal diffuse scattering measurements-Reference-Cited by-同舟云学术

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On the technique of absolutization of diffuse scattering intensity measurements based on thermal diffuse scattering measurements

Published:2010-10 Issue:5 Volume:4 Page:773-777
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Bublik V. T.,Shcherbachev K. D.,Voronova M. I.,Zhevnerov E. V.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451010050149.pdf

Reference8 articles.

1. M. A. Krivoglaz, X-Ray and Neutron Diffraction in Nonideal Crystals (Naukova Dumka, Kiev, 1983; Springer, Berlin, New York, 1996).

2. H. Trinkaus, Phys. Stat. Solidi B 51, 307 (1972).

3. W. Wooster, Diffuse X-ray Rejections from Crystals (Clarendon, Oxford, 1962; Inostr. Liter., Moscow, 1963).

4. K. D. Shcherbachev, Candidate’s Dissertation in Mathematical Physics (Moscow, 1994).

5. L. A. Charniy, K. D. Scherbachev, and V. T. Bublik, Phys. Stat. Solidi A 128, 303 (1991)

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