Effect of low-energy X-ray radiation on the electrophysical properties of silicon crystals of n- and p-type conductivity-Reference-Cited by-同舟云学术

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Effect of low-energy X-ray radiation on the electrophysical properties of silicon crystals of n- and p-type conductivity

Published:2016-05 Issue:3 Volume:10 Page:672-675
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Steblenko L. P.,Podolyan A. A.,Nadtochiy A. B.,Kuryliuk A. N.,Kalinichenko D. V.,Kobzar Yu. L.,Krit A. N.,Naumenko S. N.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451016020361.pdf

Reference11 articles.

1. V. A. Saakyan and G. N. Eritsyan, Izv. Nats. Akad. Nauk Arm., Fiz. 41 (2), 140 (2006).

2. A. G. Kadmenskii, S. G. Kadmenskii, M. N. Levin, V. M. Maslovskii, V. E. Chernyshev, Sov. Tech. Phys. Lett. 19 (3), 41 (1993).

3. B. V. Pavlyk, R. M. Lis, A. S. Gripa, D. P. Slobodzyan, I. O. Khvishchun, E. A. Shikoryak, R. I. Didyk, Ukr. Fiz. Zh. 56 (1), 65 (2011).

4. O. V. Feklisova, N. A. Yarykin, E. B. Yakimov, and I. Veber, Fiz. Tekh. Poluprovodn. (S.-Peterburg) 35 (12), 1417 (2001).

5. V. S. Vavilov, N. P. Kekelidze, and L. S. Smirnov, Effect of Radiation on Semiconductors (Nauka, Moscow, 1988) [in Russian].

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