Study of the long-range effect by the method of Rutherford backscattering with ion channeling under light irradiation of silicon-Reference-Cited by-同舟云学术

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Study of the long-range effect by the method of Rutherford backscattering with ion channeling under light irradiation of silicon

Published:2010-06 Issue:3 Volume:4 Page:515-517
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Levshunova V. L.,Pokhil G. P.,Tetel’baum D. I.,Chernykh P. N.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451010030262.pdf

Reference10 articles.

1. V. L. Levshunova, G. P. Pokhil, D. I. Tetel’baum, and V. B. Fridman, in Proc. of the 39th Intern. Conf. on Interaction Physics of Charged Particles with Crystals (Mosc. Univ., Moscow, 2009), p. 27.

2. D. I. Tetel’baum, A. A. Trofimov, A. Yu. Azov, et al., Pis’ma Zh. Tekh. Fiz. 24(23), 9 (1998) [Tech. Phys. Lett. 24, 910 (1998)].

3. D. I. Tetelbaum, A. Yu. Azov, E. V. Kuril’chik, et al., Vacuum 70(2–3), 169 (2003).

4. D. I. Tetel’baum, A. Yu. Azov, and P. I. Golyakov, Pis’ma Zh. Tekh. Fiz. 29(2), 35 (2003) [Tech. Phys. Lett. 29, 57 (2003)].

5. D. I. Tetel’baum, E. V. Kuril’chik, A. Yu. Azov, et al., Poverkhnost’, No. 4, 67 (2003).

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1. Investigation of the effect of long-range action by measuring the Kikuchi line width;Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques;2014-11

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